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Analysis of the Minute Differences between the Internal Structures of Green-Emitting Quantum Dots Via Synchrotron-Based X-Ray Photoelectron Spectroscopy
Material Research Center of Samsung Advanced Institute of Technology;
Advanced Light Source, Lawrence Berkeley National Laboratory;
Centre for Cooperative Research on Alternative Energies (CIC energiGUNE), Basque Research and Technology Alliance (BRTA), Alava Technology Park;
Departamento de Física de la Materia Condensada, Facultad de Ciencia y Tecnología, Universidad del País Vasco (UPV/EHU);
Chemical Sciences Division, Lawrence Berkeley National Laboratory
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Dong-Jin Yun
Nayoun Won
Young Mo Sung
Tae-Gon Kim
Taekhoon Kim
Ane Etxebarria
Kyungjae Lee
SooHwan Sul
Hyokeun Park
SungJun Park
Jung-Hwa Kim
Shinae Jun
Ethan Crumlin
开通知网号
The development of an analytical method for determining the properties of quantum dots(QDs) is crucial for improving the opti...
机 构:
Material Research Center of Samsung Advanced Institute of Technology;
Advanced Light Source, Lawrence Berkeley National Laboratory;
Centre for Cooperative Research on Alternative Energies (CIC energiGUNE), Basque Research and Technology Alliance (BRTA), Alava Technology Park;
Departamento de Física de la Materia Condensada, Facultad de Ciencia y Tecnología, Universidad del País Vasco (UPV/EHU);
Chemical Sciences Division, Lawrence Berkeley National Laboratory;
领 域:
物理学;
化学;
关键词:
chemical state;
indium phosphide-based quantum dot;
inelastic mean free path;
internal structure;
synchrotron-based X-ray photoelectron spectroscopy;
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Energy & Environmental Materials
2025年01期
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