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Enhanced Electrical Properties of Bi_(2-x)Sb_xTe_3 Nanoflake Thin Films Through Interface Engineering
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing,Wuhan University of Technology;
NRC (Nanostructure Research Centre),Wuhan University of Technology;
EMAT (Electron Microscopy for Materials Science),University of Antwerp
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Xudong Wu
Junjie Ding
Wenjun Cui
Weixiao Lin
Zefan Xue
Zhi Yang
Jiahui Liu
Xiaolei Nie
Wanting Zhu
Gustaaf Van Tendeloo
Xiahan Sang
开通知网号
The structure-property relationship at interfaces is difficult to probe for thermoelectric materials with a complex interfaci...
机 构:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing,Wuhan University of Technology;
NRC (Nanostructure Research Centre),Wuhan University of Technology;
EMAT (Electron Microscopy for Materials Science),University of Antwerp;
领 域:
材料科学;
工业通用技术及设备;
关键词:
Bi_2Te_3 nanoflakes;
interface engineering;
scanning transmission electron microscopy;
thermoelectric thin film;
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Energy & Environmental Materials
2024年06期
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